Lua APA (7ú heag.)

费尔史密斯 & 王文慧. (2015). 测试反模式: Common system and software testing pitfalls. 机械工业出版社.

Lua i Stíl Chicago (17ú heag.)

费尔史密斯 agus 王文慧. 测试反模式: Common System and Software Testing Pitfalls. 机械工业出版社, 2015.

Lua MLA (8ú heag.)

费尔史密斯 agus 王文慧. 测试反模式: Common System and Software Testing Pitfalls. 机械工业出版社, 2015.

Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.